Main Catalog Instrument Engineering, Metrology, Information-Measuring Instruments and Systems Laser and opto-electronic systems

Modeling multilayer optical filters for color standards in microscopy

Authors: Klopov E.V.
Published in issue: #6(101)/2025
DOI:
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems \| Chapter: Laser and opto-electronic systems
Keywords: optical microscopy, CCD matrix, single-layer systems, multilayer coating, wavelength, color standard, OpenFilters, refractive index
Published: 09.12.2025

Methods for calculating single-layer and multilayer optical coatings are presented. The dependence of the color of optical radiation on the wavelength is considered. The choice of wavelength ranges for red, green, and blue colors is explained. The type of structure obtained in the simulated program is described, and the results of calculating the dependence of the transmission coefficient on the wavelength are presented. An example of the color distortion of a nickel electroplating on an iron is shown. It is concluded that the obtained results can be applied in practice for optical microscope filters, providing improved color accuracy and visualization quality.

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