A system for measuring the amplitude-phase characteristics of ultrashort pulses at a 1.9 μm wavelength

Authors: Vanyushin M.V., Vlasov D.S., Voronets A.I.
Published in issue: #6(47)/2020
DOI: 10.18698/2541-8009-2020-6-619
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Laser and opto-electronic systems
Keywords: laser, ultrashort pulses, frequency-resolved optical gating, mid-infrared band, second harmonic generation, measuring the amplitude-phase characteristic, autocorrelation of pulse, spectrogram
Published: 29.06.2020

This work is devoted to the realization of a method for measuring the amplitude-phase characteristics of ultrashort laser pulses, called the frequency-resolved optical gating. The paper considers the implementation of the method through second harmonic generation and compares the pulse parameters obtained using this method and the measurement of the signal by a spectrometer and autocorrelator. The purpose of this work is to implement a frequency-resolved optical gating method for measuring the amplitude-phase characteristics of ultrashort laser pulses with a wavelength of 1.9 microns. This work is important because of the lack of commercially available devices for measuring these characteristics at a wavelength of 1.9 microns.

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