Malfunctions in electronics: causes, detection, repair
Authors: Chelnokov E.D., Dukhin I.D., Stakhov D.A. | |
Published in issue: #3(80)/2023 | |
DOI: 10.18698/2541-8009-2023-3-869 | |
Category: Informatics, Computer Engineering and Control | Chapter: System Analysis, Control, and Information Processing, Statistics |
|
Keywords: electronics, microelectronics, radio engineering, printed circuit boards, damage, thermoelectric destruction, diagnostics, troubleshooting methods, the impact of factors on the equipment |
|
Published: 04.04.2023 |
Electronic equipment tends to fail and malfunction, but it is not always worth replacing it with new, serviceable electronics, since it is not always advisable and economically profitable. There are often cases when there is simply no alternative on the market due to the complexity of manufacturing and logistics, and the ability to diagnose a breakdown and repair a malfunction often does not take much time and money. The paper presents the reasons for which damage may occur, their manifestation in the operation of electronics, design solutions that prevent defects from specific environmental factors, methods for diagnosing and repairing breakdowns. test
References
[1] Klassifikatsiya neispravnostey [Fault classification]. URL: https://helpiks.org/8-95905.html?ysclid=lbgy2hdp2q735672175 (accessed 02.02.2023).
[2] Tipovye neispravnosti elektronnykh ustroystv [Typical faults of electronic devices]. URL: http://www.mkuznecov.ru/content/tipovye-neispravnosti-elektronnyh-ustroystv.html?ysclid=lbgz0q04jj683523656 (accessed 02.02.2023).
[3] Pirogova E.V. Proektirovanie i tekhnologiya pechatnykh plat [Design and technology of printed circuit boards]. Moscow, Forum Publ., Infra-M Publ., 2005. (In Russ.).
[4] Vlagozashchita radioelektronnoy apparatury [Moisture protection of radioelectronic equipment]. URL: https://kit-e.ru/elcomp/vlagozashhita-radioelektronnoj-apparatury/?ysclid=lbj9og4zlf564214919 (accessed: 02.02.2023).
[5] Sidorov V.G., Shmidt N.M. Degradation phenomena and the problem of semiconductor light emitting sources reliability. Nauchno-tekhnicheskie vedomosti SPbGPU. Fiziko-matematicheskie nauki [St. Petersburg Polytechnic University Journal. Physics and Mathematics], 2013, no. 2, pp. 71–80. (In Russ.).
[6] Gridnev V.N., Gridneva G.N. Proektirovanie kommutatsionnykh struktur elektronnykh sredstv [Design of switching structures for electronic devices]. Moscow, Bauman MSTU Publ., 2014 (in Russ.).
[7] Metody poiska i ustraneniya neispravnostey. A takzhe prichin nerabotosposobnosti elektronnykh ustroystv [Troubleshooting methods. As well as the causes of electronic device inoperability]. URL: http://www.mkuznecov.ru/metodi.html?ysclid=lbgzdn0kjk381999275 (accessed: 02.02.2023).
[8] Sementsov S.G., Gridnev V.N., Sergeeva N.A. Infrared thermography methods of assessing temperature effect on reliability of electronic equipment. Vestn. Mosk. Gos. Tekh. Univ. im. N.E. Baumana, Priborostr. [Herald of the Bauman Moscow State Tech. Univ., Instrum. Eng.]2016, no. 1, pp. 3–14. DOI: http://dx.doi.org/10.18698/0236-3933-2016-1-3-14 (In Russ.).