Study of the optimal quality parameters in interferogram decoding with the fourier method

Authors: Stolyarov A.V.
Published in issue: #5(94)/2024
DOI:
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Laser and opto-electronic systems
Keywords: interferogram decoding, optimal decoding parameters, decoding using the Fourier method, phase extraction, surface shape measurement
Published: 18.11.2024

Studying the optimal parameters in interferogram decoding with the Fourier method appears to be an important task and is of great importance in the optical interferometry. The paper provides an analysis of the optimal parameters affecting the interferogram decoding accuracy with the equal-slope fringes using the Fourier method. It identifies the optimal decoding parameters including interferogram image quality and size, as well as the types of filtering and parameters of the phase unwrapping algorithms. The results show how these parameters affect correctness of the results and the error in decoding a single interferogram. The obtained data could be introduced in selecting and optimizing the key parameters in interferogram decoding with the Fourier method, which makes it possible to increase accuracy and reliability in measurements.

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