Development of a software module for organizing work with electronic documents for a research laboratory

Authors: Bolotin Yu.S., Denisova A.A.
Published in issue: #10(51)/2020
DOI: 10.18698/2541-8009-2020-10-649

Category: Informatics, Computer Engineering and Control | Chapter: System Analysis, Control, and Information Processing, Statistics

Keywords: microcircuit, “Kovcheg” computer-aided design system, large-scale integrated circuits, control and diagnostic stand, automation of documentation, measuring equipment, development of microcircuits, program-control methodology, software module, shortening the development time of microcircuits
Published: 25.11.2020

The paper considers the main methods of forming documents for the developed microcircuits and proposes an option that is most suitable for electrical computer-aided design systems. The descriptions of the folder structure with the program for measuring large-scale integrated circuits and the sequence of tests are given. The authors present a description of the algorithm for parsing files with microcircuit tests, taking into account the characteristics of the measuring equipment and the design system used. The developed software module will not only reduce the number of errors, reduce labor intensity and increase the efficiency of electronic document management, but also increase the competitiveness of domestic design systems in the world software market.


[1] Steshenko V.B. P-CAD. Tekhnologiya proektirovaniya pechatnykh plat [P-CAD. Design technology of printed circuit boards]. Sankt-Petersburg, BKhV-Peterburg Publ., 2003 (in Russ.).

[2] Gavrilov S.V., Bolotin Yu.S. [Software module development for documentation creation on the basis of large-scale integrated circuits measurements made by means of Hewlett-Packard 82000-d50 evaluation system]. Mat. Mezhd. nauch.-prakt. konf. Aktual’nye problemy informatizatsii v tsifrovoy ekonomike i nauchnykh issledovaniyakh [Proc. Int. Sci.-Tech. Conf. Actual problems of informatization in digital economics and scientific research]. Moscow, MIET Publ., 2019, pp. 37–41 (in Russ.).

[3] Saurov A.N., ed. Metodologiya proektirovaniya i osvoenie proizvodstva [Design methodology and commercial production]. Moscow, Tekhnosfera Publ., 2019 (in Russ.).

[4] Magerramov R.V. Application of diagnostic test bench for testing microcircuits. Molodoy uchenyy [Young Scientist], 2016, no. 17, pp. 53–57 (in Russ.).

[5] Chernikov B.V., Mozhzhukhina A.V., Borisova E.A. Problems of error localization during specialized LSI developing. Sovremennye naukoemkie tekhnologii [Modern high technologies], 2019, no. 11-2, pp. 301–305. DOI: https://doi.org/10.17513/snt.37808 (in Russ.).

[6] Krupeychenko I.A., Denisova A.A. Method for defining potentially defect crystals of microcircuits by results of electrical parameters distribution analysis. XXXVII Mezhd. nauch.-prakt. konf. Actual scientific research [XXXVII Int. Sci.-Tech. Conf. Actual Scientific Research]. 2018. Astrakhan’, Olimp Publ., 2018, pp. 151–153 (in Russ.).

[7] Magerramov R.V. Testing process of integral microcircuits. Molodoy uchenyy [Young Scientist], 2015, no. 13, pp. 154–158 (in Russ.).