MainCatalogInstrument Engineering, Metrology, Information-Measuring Instruments and Systems All articles
Method for simulating the optical surface real shape based on results of processing the interference pattern.
| Authors: Khalil S., Druzhin V.V. | Published: 24.07.2023 |
| Published in issue: #7(84)/2023 | |
| DOI: DOI: 10.18698/2541-8009-2023-7-920 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Laser and opto-electronic systems | |
| Keywords: optical system calculation, optical control, surface shape measurement, interference pattern processing, inverse problems | |
Software system linkage using the static and dynamic libraries
| Authors: Lutsuk R.A., Melnikov D.V., Novikov T.A. | Published: 27.07.2023 |
| Published in issue: #7(84)/2023 | |
| DOI: DOI: 10.18698/2541-8009-2023-7-921 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Solid-state electronics, radioelectronic components, micro - and nanoelectronics | |
| Keywords: programming, software, design, compilation, linkage, linker, static and dynamic libraries, project assembly | |
Metrological problems in microplastcs quantitative determination in the water basins
| Authors: Oleshko A.V. | Published: 11.09.2023 |
| Published in issue: #8(85)/2023 | |
| DOI: DOI: 10.18698/2541-8009-2023-8-929 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
| Keywords: microplastics, metrology, metrological problems, sampling, identification, aquatic environment, measurement accuracy, error | |
Analysis of methods in determining natural frequencies of the on-board electronic equipment
| Authors: Zaplatin O.A., Toshmamatov S.F. | Published: 26.02.2024 |
| Published in issue: #1(90)/2024 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Solid-state electronics, radioelectronic components, micro - and nanoelectronics | |
| Keywords: natural frequency, simplified model, oscillation analysis, modal analysis, printed circuit board, radio electronic equipment, electronic equipment | |
Development of the motivation and personnel involvement system within the framework of the lean manufacturing concept
| Authors: Zaplatin O.A., Toshmamatov S.F., Volynkina M.M., Shirokov D.E. | Published: 01.05.2024 |
| Published in issue: #2(91)/2024 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Solid-state electronics, radioelectronic components, micro - and nanoelectronics | |
| Keywords: lean manufacturing, manufacture organization, personnel management, personnel motivation, Herzberg's theory, Gerchikov's typology, motivation profile | |
Serial interfaces conversion method
| Authors: Zakernichny I.V. | Published: 26.09.2024 |
| Published in issue: #4(93)/2024 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Solid-state electronics, radioelectronic components, micro - and nanoelectronics | |
| Keywords: serial interface, interface conversion, PS/2 interface, microcontroller, keyboard, debug board, program algorithm, oscillogram | |
Study of the optimal quality parameters in interferogram decoding with the fourier method
| Authors: Stolyarov A.V. | Published: 18.11.2024 |
| Published in issue: #5(94)/2024 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Laser and opto-electronic systems | |
| Keywords: interferogram decoding, optimal decoding parameters, decoding using the Fourier method, phase extraction, surface shape measurement | |
Analysis of radiation-resistant integrated microcircuits cases
| Authors: Mironov A.A., Khlebnikov V.I. | Published: 28.07.2025 |
| Published in issue: #3(98)/2025 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Solid-state electronics, radioelectronic components, micro - and nanoelectronics | |
| Keywords: radiation resistance, integrated circuits (IC), casing, radiation exposure, radiation protection, radiation-resistant electronics, space industry, nuclear power, radiation protection screens (RPS), composite materials | |
Field-effect transistors
| Authors: Paragulgov A.M., Glinskaya E.V. | Published: 27.09.2025 |
| Published in issue: #4(99)/2025 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Solid-state electronics, radioelectronic components, micro - and nanoelectronics | |
| Keywords: field-effect transistors, control p-n junction, current-voltage characteristics, high input resistance, analog circuits, photodiode amplifier, frequency properties, variable resistance | |
Modeling multilayer optical filters for color standards in microscopy
| Authors: Klopov E.V. | Published: 09.12.2025 |
| Published in issue: #6(101)/2025 | |
| DOI: DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Laser and opto-electronic systems | |
| Keywords: optical microscopy, CCD matrix, single-layer systems, multilayer coating, wavelength, color standard, OpenFilters, refractive index | |